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Simulating state-dependent systems with partial aging in standby

Nikolova, N ORCID: 0000-0001-6160-6282, Fan, G, Symes, M ORCID: 0000-0003-2241-4995 and Tenekedjiev, K ORCID: 0000-0003-3549-0671 2020 , 'Simulating state-dependent systems with partial aging in standby', in Proceedings of the 10th International Conference on Intelligent Systems (IS) , Institute of Electrical and Electronics Engineers, United States, pp. 51-60 , doi: 10.1109/IS48319.2020.9200193.

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We analyze a two-component standby system with failures in standby (2SBS). Typically, such a system is interpreted as a state-dependent system with time-dependent failure rates. When the backup component is aging in standby as if it is working, the 2SBS is denoted as 2SBS with full aging. Such a system can be modelled with a system of ODEs and may have a numerical solution. Alternatively, simulation modelling can generate the probability of the system and estimate the important reliability characteristics. However, when the backup component does not age in standby (2SBS with no aging), or when the backup component ages in standby slower than in operation (2SBS with partial aging), then there is no system of ODEs because the system is not state dependent. We develop simulation algorithms to solve the 2SBS with no aging and with partial aging. The partial aging model assumes that the aging uses reliability as a proxy variable for aging and introduces the equivalent aging time T* as the starting time for the conditional reliability function of the backup component in standby. An extensive numerical example is provided.

Item Type: Conference Publication
Authors/Creators:Nikolova, N and Fan, G and Symes, M and Tenekedjiev, K
Keywords: reliability, standby systems, Markov models, state probability functions, full aging in standby, no aging in standby, ageing, differential equations, failure analysis, probability, reliability, 2SBS, time dependent failure rates, partial aging model
Journal or Publication Title: Proceedings of the 10th International Conference on Intelligent Systems (IS)
Publisher: Institute of Electrical and Electronics Engineers
DOI / ID Number: 10.1109/IS48319.2020.9200193
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Copyright 2020 IEEE

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